Abstract
This paper analyzes the different types of test escape with the final objective to propose a solution to minimize some of the test escapes. Using a simple example of short defect in the context of Boolean testing, it is first demonstrated that the defect behavior depends on unpredictable parameters. It is shown that a defect may be detectable with a vector but for a given domain of the unpredictable parameter called the Detection Domain. Using the concept of Detection Domain, 3 different types of test escape are identified. It is then demonstrated that one type of test escape can be minimized using 'Improved fault models'.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.