Abstract
Software reliability growth models are developed here in order to relate software reliability to the effect of the test-effort spent on software testing. These models are based on non-homogeneous Poisson processes (NHPPs) which describe a software error detection phenomenon. The test-effort functions are expressed by exponential and Rayleigh curves. The estimators for the test-effort parameters are given by the method of least-squares, and those for the reliability growth parameters in the NHPP models by the method of maximum-likelihood. Using actual test data, software reliability analyses are illustrated.
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