Abstract
An examination is made of some of the factors affecting testability of mixed analog and digital ASIC (application-specific integrated circuit) standard cells. The influence of process characterization, accurate simulation models, and partitioning of digital and analog circuitry is discussed. In addition, the digitizing of the functionality of analog cells and applying testing strategies for complex digital systems are considered. Analog parameters which can be measured with a digital VLSI tester are also described. >
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
