Terahertz vision using field effect transistors detectors arrays

Abstract

An overview of main results concerning THz detection related to plasma nonlinearities in nanometer field effect transistors is presented. In particular nonlinearity and dynamic range of these detectors are discussed. As the main result, we will show some of the first real-world applications of the FET THz detectors: demonstrators of the imager developed for fast postal security and industrial nondestructive quality control.