Abstract
We present experimental results of the transmission magnitude and phase change of terahertz pulses through thin metallic films patterned with subwavelength hole arrays on silicon wafers. Terahertz time-domain spectroscopy measurements reveal a sharp phase peak centered on the surface plasmon resonance. Correspondingly, and consistent with the Kramers-Kronig relations, the measured transmission magnitude has the shape of the derivative of this peak. In addition, we determine that the aperture shape has a notable effect on the transmission properties of two-dimensional hole arrays.
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