Abstract
We have developed a terahertz time-domain spectroscopy (THz-TDS) system for reflectivity measurement with a temperature-controllable cryostat. For emission and detection of THz radiation, a Ti:Sapphire pulsed laser and photoconductive antennas are used. Two wire-grid polarizers enable us to carry out the polarized reflectivity measurements. Using our THz-TDS system, we measured the c-axis polarized reflectivity spectra for La 2− x Sr x CuO 4 single crystals ( x = 0.10 and 0.13) and observed sharp Josephson plasma edges for both samples below T c. The reflectivity spectra of the x = 0.10 sample were in good agreement with those reported previously, which confirms the validity of the system. For the x = 0.13 sample, we discuss the anomolous features of the optical spectra.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
