Terahertz imaging using strained-Si MODFETs as sensors

Abstract

We report on non-resonant (broadband) and resonant detection of terahertz radiation using strained-Si modulation doped field effect transistors. The devices were excited at room temperature by two types of terahertz sources (an electronic source based on frequency multipliers at 0.292THz and a pulsed parametric laser at 1.5THz). In both cases, a non-resonant response with maxima around the threshold voltage was observed. Shubnikov-de Haas and photoresponse measurements were performed simultaneously and showed a phase-shift of π/2 in good agreement with the theory, which demonstrates that the observed response is related to the plasma waves oscillation in the channel. The non-resonant features were used to demonstrate the capabilities of such devices in terahertz imaging. We also cooled our device down to 4.2K to increase the quality factor and resonant detection was observed by using a tunable source of terahertz radiation.