Abstract
In this study, 75TeO2–25ZnO and 70TeO2–30ZnO (mol %) (TZ) glasses were synthesized by using a traditional melt-quenching method. The synthesized TZ glasses were deposited as a thin film using the thermionic vacuum arc (TVA) system. The structure of the deposited TZ thin films and the synthesized TZ bulk glass samples were compared. The structural properties of the TZ thin films and bulk glass samples were determined by using X-ray diffraction (XRD) analysis, Raman spectroscopy, and Fourier Transform Infrared Spectroscopy (FT-IR). The morphological properties of the TZ thin films were obtained by using field emission scanning electron microscopy (FE-SEM) images and atomic force microscopy (AFM). The optical properties of bulk glass samples are obtained with ultraviolet–visible spectrophotometry in the range of 350–1000 nm. Lastly, the electrical properties were obtained by using dielectric spectroscopy. XRD and Raman analysis showed that the TZ thin films had an amorphous structure similar to the synthesized bulk glasses with limited crystallization. The results show homogenous and amorphous thin film structures with few polycrystalline formations.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
