Abstract
Cardiovascular implantable electronic device (CIED) infection is associated with significant patient morbidity and mortality. The PADIT device infection prediction score was recently described. The PADIT score can range from 0 to 15 and includes prior procedures [P], age [A], depressed renal function [D], immunocompromise [I], and procedure type [T]. The PADIT score classifies patients into low (0-4), intermediate (5-6), and high (≥7) risk groups for device infection. We sought to assess the temporal trends in PADIT score and rates of CIED infections over time.
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