Abstract
A technique to characterize ultrashort x-ray pulses which uses x-ray anomalous transmission in thick crystals (Borrmann effect) is proposed. By exciting coherent optical phonons in a Laue crystal with a fs-laser pulse and measuring the energy of the output diffracted x-ray pulse versus the delay between the two pulses, the temporal structure of the x-ray pulse can be determined with a temporal resolution comparable to the period of the excited vibration. The use of materials with high optical phonon frequencies $(\ensuremath{\geqslant}1000\phantom{\rule{0.3em}{0ex}}{\mathrm{cm}}^{\ensuremath{-}1})$ would make possible characterization of hard x-ray pulses on a time scale of a few tens of femtoseconds.
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