Temperature-Resolved Infrared Spectral Emissivity of SiC and Pt–10Rh for Temperatures up to 900°C

Abstract

This article reports the first comprehensive results obtained from a fully functional, recently established infrared spectral-emissivity measurement facility at the National Institute of Standards and Technology (NIST). First, sample surface temperatures are obtained with a radiometer using actual emittance values from a newly designed sphere reflectometer and a comparison between the radiometer temperatures and contact thermometry results is presented. Spectral emissivity measurements are made by comparison of the sample spectral radiance to that of a reference blackbody at a similar (but not identical) temperature. Initial materials selected for measurement are potential candidates for use as spectral emissivity standards or are of particular technical interest. Temperature-resolved measurements of the spectral directional emissivity of SiC and Pt–10Rh are performed in the spectral range of 2–20 μm, over a temperature range from 300 to 900°C at normal incidence. Further, a careful study of the uncertainty components of this measurement is presented.