Temperature-dependent quantitative 3ω scanning thermal microscopy: Local thermal conductivity changes in NiTi microstructures induced by martensite-austenite phase transition

Abstract

We develop the theoretical description of 3omega signals from the resistive Wollaston thermal probe (ThP) of a scanning thermal microscope (SThM) in terms of an equivalent low-pass filter. The normalized amplitude and phase frequency spectra are completely characterized by a single parameter, the crossover frequency f(c)(k) depending on the sample thermal conductivity k. The application concerns polycrystalline NiTi shape memory alloy microstructured by focused Ga ion beam milling and implantation. The calibration of the ThP combined with a novel two-step normalization procedure allowed quantitative exploitation of 3omega signal variations as small as -1.75% in amplitude and 0.60 degrees in phase upon heating the sample from room temperature to 100 degrees C. This corresponds to k increase of 23.9% that is consistent with the expected thermal conductivity variation due to martensite-austenite structural phase transition. To our knowledge this is for the first time that SThM 3omega phase information is used quantitatively as well. The static, calibrated 3omega measurements are complementary to 3omega SThM images of the patterned sample surface. The local SThM measurement of temperature-dependent thermal conductivity opens the possibility to imaging structural phase transitions at submicron scale.