Abstract
We have measured the resonance spectrum of glide-plane forbidden x-ray diffraction in hexagonal ZnO as a function of temperature. This is the only method to observe deformations of the electronic states caused by thermal atomic motion. The results provide the first evidence for a complex line shape in the spectrum of thermal-motion-induced scattering and the first observation of a dramatic change in resonance spectrum with temperature. The measurements are in agreement with a phenomenological model, based on a combination of constant (most probably dipole-quadrupole) and temperature-dependent amplitudes. This model provides a means of separating the two components, including their relative phase.
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