Abstract
Polycrystalline (Pb0.75La0.25)TiO3 (PLT25) thin films have been fabricated on Pt/Ti/SiO2/Si substrates by pulsed laser deposition. The room-temperature structures and dielectric properties are studied by x-ray diffraction, scanning electron microscopy, and HP4294A impedance/phase analyzer. The temperature-dependent ferroelectric properties are systematically investigated by using a RT66A ferroelectric tester combined with a temperature-controllable vacuum chamber. For well-saturated hysteresis loops, with the temperature decrease from 295 to 97 K, the coercive field (Ec) and remanent polarization (Pr) increase and the saturated polarization (Ps) is almost temperature-independent. However, this is not the case for the unsaturated hysteresis loops. Temperature-dependent fatigue-resistance of the PLT25 films is also experimentally established: after 2.22 × 109 switching cycles, the nonvolatile polarizationdecreases 38% when measured at room-temperature and it decreases 15% at 97 K. The nature and population of point defects and their effects on the subtle variations of the Ec, Ps, Pr, and fatigue-resistance against temperature are discussed in detail.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
