Abstract
The authors use high-resolution charge-coupled device based thermoreflectance to derive two dimensional facet temperature maps of a λ=1.55μm InGaAsP∕InP watt-class laser that has a large (>5×5μm2) fundamental optical mode. Recognizing that temperature rise in the laser will lead to refractive index increase, they use the measured temperature profiles as an input to a finite-element mode solver, predicting bias-dependent spatial mode behavior that agrees well with experimental observations. These results demonstrate the general usefulness of high-resolution thermal imaging for studying spatial mode dynamics in photonic devices.
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