Abstract
The concept of having the effective refractive index of an optical waveguide mode be independent of temperature is introduced. It is shown that this concept should be realizable with a Corning 7059 glass thin-film waveguide supported on a SiO(2)-Si substrate for a waveguide thickness of 0.37 microm. Measurements of effective refractive index as a function of temperature confirm this prediction of temperature independence in that they show a very small variation with temperature for a 0.35-microm thick waveguide in comparison with that for a 0.98-microm thick waveguide.
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