Abstract
Using a method of laser ablation, a number of AgI–chalcogenide glass nanolayered films has been obtained with different thicknesses of the layers (10, 25, 50, and 100 nm). In order to study α ⇆ β phase transition in AgI, X-ray phase analysis has been carried out in the temperature range from 30 to 200°C. A correlation between the layer thickness and the temperature of the α → β phase transition during the lowering of the temperature is found. An explanation of the correlation is proposed.
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