Abstract
Abstract Three models of flux pinning are discussed in terms of their basic geometric characteristics. The models are distinguished by their predictions of the field, temperature and sample size dependence of resistivity in an applied magnetic field below T c . Field dependent resistance data below T c from several good quality thin film samples and a single crystal are examined to extract activation energies and the resistivity pre-factor. A universal correlation between the latter two quantities and evidence that activation energies scale with sample thickness point strongly to a model involving flux pinning along a line as the most appropriate to describe thermally activated flux creep behaviour. These data also indicate that vortex lines are straight and the vortex lattice ordered for fields along the c -axis and for sample thickness up to at least ∽ 20 μm provided one is not too close to T c .
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