Abstract
Solution-processed core/shell quantum dot films are of great significance for light-emitting diodes. It is well known that the operation of core/shell quantum dot-based light-emitting diodes largely relies on charge transport. However, the charge transport mechanism in quantum dot films is still under debate and inconclusive. Herein, the temperature-dependent charge transport properties of light-emitting core/shell colloidal quantum dot thin films are characterized and analyzed across a wide temperature range, and the charge transport mechanism is studied. The results reveal that Poole–Frenkel emission conduction is applicable in the high-temperature range. With the decrease in the temperature, the measured current can be described by the Efros–Shklovskii variable-range hopping model. It is worth noting that, in both cases, trap states and disorders in the quantum dot film play a very important role in charge transport. These findings are of great importance for optimizing quantum dot light-emitting diodes and understanding the effects of charge transport on the device performance.
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