Abstract
Pure and doped Polyvinylidene difluoride (PVDF) films, for the detection of infrared radiation, have been well documented using the mechanism of pyroelectricity. Alternatively, the electrical properties of films made from Polyvinyl Alcohol (PVA) have received considerable attention in recent years. The investigation of surface resistivities of both such films, to this point, has received far less consideration in comparison to pyroelectric effects. In this research, we report temperature dependent surface resistivity measurements of commercial, and of multiwall carbon nanotubes (MWCNT), or Ag-nanoparticle doped PVA films. Without any variation in the temperature range from 22°C to 40°C with controlled humidity, we found that the surface resistivity decreases initially, reaches a minimum, but rises steadily as the temperature continues to increase. This research was conducted with the combined instrumentation of the Keithley Model 6517 Electrometer and Keithley Model 8009 resistivity test fixture using both commercial and in-house produced organic thin films. With the objective to quantify the suitability of PVDF and PVA films as IR detector materials, when using the surface resistivity phenomenon, instead of or in addition to the pyroelectricity, surface resistivity measurements are reported when considering bolometry. We found that the surface resistivity measurements on PVA films were readily implemented.
Highlights
Applications of dielectric films based on properties of such materials have been an important topic in electronics and the semiconductor industry for scores of years
Add the polyvinyl alcohol particles slowly so that each particle is “wetted” allowing each particle to go into solution, while still stirring magnetically and being cautious to not overheat the mixture (Overheating the mixture will cause the solvent to evaporate too quickly, and an undesirable thick gooey mass of wet polymer will settle out and stick to the wall of the beaker)
Polyvinylidene difluoride (PVDF) thin films can be developed from the solution casting technique, yet the production of larger, stress free PVDF films, remains as an ongoing task for us
Summary
Applications of dielectric films based on properties of such materials have been an important topic in electronics and the semiconductor industry for scores of years. In addition to bulk property considerations, understanding the surface properties [4] [5] of such films has become extremely important in recent years, occurring simultaneously as MOSFETs have become much smaller in size. The development of appropriate surface configured thin films and testing the electrical current on the surfaces of such films have become the focus of this investigation. We have determined the surface resistivity characterization of PVA dielectrics to be a important physical phenomenon to investigate owing to its probable use in sensor science or even in IR detection likening to that of the PVDF material that we have studied previously [6]-[9]. In this study, we have included measurements on commercial and doped PVA films, with either MWCNT or Ag-nanoparticles as dopants [10] [11], while no measurements have been reported here on PVDF films
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