Abstract
AbstractThis temperature‐dependent Raman study of kesterite phase Cu2ZnSnS4 (CZTS) thin film was performed over the temperature range 98–378 K. A detailed qualitative analysis showed that the Raman data for the “A” mode of vibration, the strongest peak for kesterite CZTS films, fit very well to a damped harmonic oscillator (DHO) model. This investigation of temperature‐dependent Raman data shows that the observed frequency shift is due to the cumulative effect of thermal expansion and anharmonicity resulting from a 4‐phonon damping process. The temperature dependence of linewidth is also consistent with the above analysis.
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