Abstract
Coating polar dielectrics with thin film vanadium dioxide (VO2) enables one to exploit the temperature-dependent phase transition within VO2 to actively tune and modulate surface phonon polaritons at mid-infrared. However, controlling the behavior of such systems requires intimate knowledge of the temperature-dependent optical constants of VO2, which depend greatly on the growth conditions and substrate material. Here, we accurately determine the complex optical constants of VO2 on polar dielectrics across the insulator-to-metal phase transition (IMT) using only normal incident reflectance spectra by analyzing the reflectance with Kramers–Kronig relations and thin film Fresnel equations. This non-ellipsometry technique offers an advantage in determining the refractive index using a standard infrared spectrometer.
Published Version
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