Abstract
Field emission and vacuum breakdown limit performance in many classes of electronic devices, including rf systems in particle accelerators. Although there are general explanations of both processes, a large correction factor is systematically needed to explain observations, and experimental evidence to establish the breakdown mechanism is limited. This study elucidates both issues, using a high-voltage electrode system that can operate down to cryogenic temperatures. Measurements of temperature-dependent field emission and breakdown with this system reveal remarkable effects that yield insight into both processes, which in turn will enable further development of high-field technology.
Highlights
Electron field emission (FE) and vacuum arcing are phenomena that are important for a wide range of applications, including normal conducting and superconducting accelerators
A significant, up to 50%, increase in the breakdown threshold and remarkable stability of field emission are observed when cooled to cryogenic temperatures compared to room temperature
BD nucleation models and the nature of intrinsic field enhancement features can be studied in an original way exploiting temperature dependence, and to this end a dedicated experimental setup has been constructed and high-field measurements have been made in the range from room down to cryogenic temperatures
Summary
Electron field emission (FE) and vacuum arcing (breakdown) are phenomena that are important for a wide range of applications, including normal conducting and superconducting accelerators. Temperature-Dependent Field Emission and Breakdown Measurements Using a Pulsed High-Voltage Cryosystem The measurements are made at ambient to cryogenic temperatures and include conditioning, breakdown threshold, and field emission.
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