Abstract
The activation energy (Ea) for DC drifts of x-cut LiNbO3 (LN) modulators was obtained to be 1.4 ± 0.2 eV based on statistical consideration of long-term biased aging test data at 100 and 120°C. Ea = 1.4 eV means that 20 years of device life at 65°C – common system requirements – can be promptly tested by 9 days' aging at 120°C.
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