Abstract
Microelectronics Research Centre, Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 0HE, U. K. Department of Physical Electronics, Tokyo Institute of Technology, Tokyo 152-8552, Japan, and SORST JST (Japan Science and Technology). Hitachi Cambridge Laboratory, Madingley Road, Cambridge CB3 0HE, U. K. Electronic Devices and Materials Group, Engineering Department, University of Cambridge, Trumpington Street, Cambridge CB2 1PZ, U. K., and SORST JST (Japan Science and Technology) *Phone: +44 1223 764657 FAX: +44 1223 332662 E-mail: zakd100@cam.ac.uk
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