Abstract
An interferometric method was used for the determination of refractive index of glassy SiO2 in the infrared (IR) wavelength region (1.44<λ<4.77μm) at temperatures ranging from 23.5 to 481°C by IR spectroscopy. The refractive index was found to increase with temperature at a given wavelength. Irregularities of the thermal coefficient of the refractive index (dn/dT) with temperature were observed and explained by the existence of crystal-like microstructures in silica glass. Optical dispersion (dn/dλ) exhibits a maximum at a given temperature. The wavelength at the maximum depends on temperature, showing irregularities with temperature like the thermal coefficient of refractive index.
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