Temperature dependence of luminescence decay in Sn-doped silica

Abstract

We report an experimental study on the temperature dependence, in the range 18–300 K, of the decay kinetics of the emission at 4.1 eV from the first excited electronic state of oxygen deficient centers in a 2000 ppm Sn-doped sol–gel silica. At low temperature, this luminescence decays exponentially with a lifetime of 8.4 ns, whereas, on increasing the temperature, the time decay decreases and cannot be fitted with an exponential function. These results are expected if there is a competition between the radiative and the thermally activated intersystem-crossing decay channels toward the associated triplet state. The comparison with previous data in pure oxygen-deficient and Ge-doped silica gives new insight on the effect of the host-matrix dynamics on the electronic properties of this type of point defect.