Temperature dependence of hole mobility in n-type InSb upon electron bombardment

Abstract

Abstract The mobility of the minority carriers, in n -InSb was investigated from the photomagnetoelectric effect as a function of temperature in the range of 12–80 K prior to and after bombardment with 1 MeV average energy beta particles. The hole mobility shows a minimum near 40 K which can be due to the h-e scattering becoming predominant in the region where other scattering mechanisms are relatively weak. After bombardment the curves have the same form but higher mobilities. This is due to a decrease of h-e scattering resulting from the decrease of the electron concentration, as determined from independent measurements.