Abstract
AbstractAn electric field loading stage was designed for use in a laboratory diffractometer that enables in situ investigations of the temperature dependence in the field response mechanisms of ferroelectric materials. The stage was demonstrated by measuring PbZr1−xTixO3 (PZT) based materials—a commercially available PZT and a 1% Nb‐doped PbZr0.56Ti0.44O3 (PZT 56/44)—over a temperature range of 25°C to 250°C. The degree of non‐180° domain alignment (η002) of the PZT as a function of temperature was quantified. η002 of the commercially available PZT increases exponentially with temperature, and was analyzed as a thermally activated process as described by the Arrhenius law. The activation energy for thermally activated domain wall depinning process in PZT was found to be 0.47 eV. Additionally, a field‐induced rhombohedral to tetragonal phase transition was observed 5°C below the rhombohedral‐tetragonal transition in PZT 56/44 ceramic. The field‐induced tetragonal phase fraction was increased 41.8% after electrical cycling. A large amount of domain switching (η002=0.45 at 1.75 kV/mm) was observed in the induced tetragonal phase.
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