Abstract
The temperature coefficient of the resistance of chromium-copper films has been measured in the thickness range 500–4900 Å from 33 to 190°C. It is observed that the Fuchs-Sondheimer theory explains the observed thickness dependence satisfactorily. The mean free path of the conduction electrons and the TCR of an infinitely thick film have been computed as 363 Å and 2.886 × 10 −3° C −1 respectively at 33°C. A linear variation of the reciprocal mean free path with temperature has also been established.
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