Abstract

This paper deals with the performance/temperature tradeoff in an ultra-low voltage, ultra-low power rail-to-rail dynamic voltage comparator made solely by digital standard cells. The digital nature of the comparator makes its design technology portable also enabling its operation at very low supply voltages down to deep sub-threshold. In particular, as sub-threshold circuits have a significant temperature dependence, this paper focuses on the comparator performance under different supply voltages and temperatures. Measurements performed on a 180nm testchip show correct operation under rail-to-rail common-mode input at a supply voltage ranging from 0.6V down to 0.15V. Moreover, the measurements under temperature variations of offset, clock-to-output delay, and power in the range from -25 °C to 75 °C show the respective performance trade-offs.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.