Abstract
Analytical relations that describe the temperature dependence of resistance in classical percolation and percolation-like systems are presented for the first time. Three concentration ranges of conductive phase below and above the percolation threshold, as well as inside the smearing region, have been analysed. The useability of the presented results has been discussed for such random inhomogeneous media as cermet and polymer thick film resistors, as well as cermet thin film resistors.
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