Abstract
A high resolution imaging of the temperature and microwave near field can be a powerful tool for the non-destructive testing of materials and devices. However, it is presently a very challenging issue due to the lack of a practical measurement pathway. In this work, we propose and demonstrate experimentally a practical method resolving the issue by using a conventional CCD-based optical indicator microscope system. The present method utilizes the heat caused by an interaction between the material and an electromagnetic wave, and visualizes the heat source distribution from the measured photoelastic images. By using a slide glass coated by a metal thin film as the indicator, we obtain optically resolved temperature, electric, and magnetic microwave near field images selectively with a comparable sensitivity, response time, and bandwidth of existing methods. The present method provides a practical way to characterize the thermal and electromagnetic properties of materials and devices under various environments.
Highlights
Polarized light microscope and a typical slide glass, and the measurement principle is based on a generally occurring physical phenomenon in that heat is always involved whenever a material interacts with an electromagnetic wave
We present examples demonstrating that TEOIM provides a comparable measurement performance to that of existing methods, a capability of visualizing the temperature and the microwave near field (MWNF) distribution for various experimental conditions
The optical indicator (OI) composed of a glass substrate coated by a thin film absorbing the heat, IR or EM field radiated from a device under test (DUT), is placed on the DUT and monitored by a polarized light microscope system (Fig. 1a)
Summary
Polarized light microscope and a typical slide glass, and the measurement principle is based on a generally occurring physical phenomenon in that heat is always involved whenever a material interacts with an electromagnetic wave. The simplicity of the measurement system and the generality of the measurement principle are attractive features for the implementation of a practical measurement system resolving problems of previous methods. We discuss the measurement performance of TEOIM such as spatial resolution, response time, bandwidth, and sensitivity. We present examples demonstrating that TEOIM provides a comparable measurement performance to that of existing methods, a capability of visualizing the temperature and the MWNF distribution for various experimental conditions
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