Temperature and frequency dependent dielectric and electrical properties of relaxor (Ca1/2W1/2)(Pb1/2Ni1/2)O3 electronic material

Abstract

In the present study, a solid-state reaction technique is used to formulate and synthesize the (Ca0.5W0.5)(Pb0.5Ni0.5)O3, [CWPN] relaxor perovskite composite. Its structural, morphological, and electrical characteristics have all been revealed so that they may be studied for potential use in electronics and sensors. X-ray diffraction analyses have confirmed the structure to be combination of primary tetragonal along with secondary rhombohedral and orthorhombic phase. Throughout a wide temperature and frequency range (25° – 500° C and 1 kHz–1 MHz), the impedance spectroscopy, dielectric, and a.c. conductivity have all been analyzed. The sample's dielectric spectroscopy confirmed its relaxor properties. On a Nyquist plot, the sample's grain contribution is represented by a single semicircular arc. A replica of a similar circuit was constructed so that its electrical characteristics could be studied. Both the activation energy and the mobility of the charge carriers have been evaluated. Conducting systematic studies of dielectric properties at elevated temperatures is crucial for fundamental characterization and device development, as it allows for the analysis of electrical parameters associated with surfaces, grain borders, or grains.