Abstract
Current-voltage (I-V) curves of poly(3-hexylthiophene) (P3HT) diodes have been collected to investigate the polymer hole-dominated charge transport. At room temperature and at low electric fields the I-V characteristic is purely Ohmic whereas at medium-high electric fields, experimental data shows that the hole transport is trap dominated in the space charge limited current (SCLC) regime. In this regime, it is possible to extract the I-V characteristic of the P3HT/Al junction showing the ideal Schottky diode behavior over five orders of magnitude. At high-applied electric fields, holes’ transport is found to be in the trap free SCLC regime. We have measured and modeled in this regime the holes’ mobility to evaluate its dependence from the electric field applied and the temperature of the device.
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