Abstract

Abstract High Purity Germanium (HPGe) crystals are indispensable for radiation detection and fundamental research. Among other applications they will be used in the Large Enriched Germanium Experiment for Neutrinoless double beta Decay (LEGEND) experiment for the search of neutrinoless double beta decay of 76 Ge. Ongoing research activities are done in collaboration with members of the existing GERDA experiment. In this context the Leibniz-Institut fur Kristallzuchtung (IKZ) is engaged in the development of HPGe Czochralski crystal growth including purification and characterization of the material. The Ge starting material is purified in a horizontal multi-zone furnace. Two inch Ge single crystals were grown by the Czochralski method and analyzed with respect to electrically active impurities by means of Hall-effect measurements and Photo-thermal Ionization Spectroscopy. The dislocation density is assessed by combining defect etching and optically microscopy imaging. Lateral Photovoltage Scanning is applied to visualize doping striations, which bear information on the shape of the solid–liquid phase boundary during growth.

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