Technological and Design Improvements of FBK NUV Silicon-Photomultipliers

Abstract

Single-photon detectors are employed to measure faint light signals with high detection efficiency and time resolution. Silicon photomultipliers (SiPMs) are arrays of Single-photon avalanche diodes (SPADs), each one with its quenching resistor; they are connected in parallel giving a signal proportional to the number of detected photons. They offer the typical advantages of solid-state detectors (e.g. ruggedness, low power consumption, small size), high detection efficiency, good time resolution [1] and very good photon-number resolving capabilities. In FBK we produce SiPMs and SPADs with detection efficiency peaked for blue/ultraviolet light (called NUV technology) [2], or green-red light detection (RGB technology), with different geometries. The former are typically employed in a large number of applications exploiting scintillators [3]. Looking for the maximization of the photo-detection efficiency (PDE), e.g. increasing the fill-factor (FF) of the SiPM cell, noise components such as afterpulsing and optical crosstalk between cells (i.e. the correlated noise) become important issues. Recently, we developed new NUV-SiPMs, with high detection efficiency and with different solutions to reduce the noise of the detectors, both at a technological level [4] and a cell-layout level. Here we show the performance of this new NUV-SiPM, produced at FBK, employing a new silicon substrate, with a reduced minority-carriers lifetime, and new SiPM with trenches between cells and high cell density.