Abstract
To make feasible X-ray analysis of rapidly changing structures, a method for collecting time-resolved diffraction data has been developed. The method is based on detection of the times and positions of X-ray photons scattered from the specimen under a structural change by means of a multiwire position sensitive counter and on recording this information in computer memory. Data measured over many cycles of the transition are processed by a computer program to obtain diffraction diagrams at arbitrary phases of the periodic change with the highest time resolution of 50 µs. The system is useful for dynamic study of muscle contraction and other transient phenomena involving rapid change of atomic or molecular structure on a millisecond time scale.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
