Technical Theme Topics

Abstract

Electromagnetic near-field scanning has been receiving great attention from EMC engineers as it enables understanding of the electromagnetic behavior of electronic components and sub-systems. The technique allows for intra- and inter-system assessment of EMC characteristics even at the early design stage of the product without requiring expensive test facilities, such as semi-anechoic chambers. Also, the acquired near-field data can be post-processed with the objective to obtain equivalent radiation source distributions to be used to predict far-field radiation. Data acquisition and post-processing usually take advantage of advanced machine learning algorithms, whose exploitation allows optimizing the process in terms of time, computational burden, and prediction accuracy.