Abstract
Abstract The intense use of computers to operate electron microscopes as well as the ability to control microscopes remotely over the Internet, is increasingly changing the way electron microscopes are being used and how microscopy is being taught. Practically all of the top-of-the-line electron microscopes offered by the microscope vendors today are fully computer controllable, and provide for digital imaging. The combination of both features with the ever increasing speed of computers has created a situation that has and will continue to change the way electron microscopists work. Lehigh University together with Oak Ridge National Laboratory have collaborated since 1996 to make the instrumentation in the High Temperature Materials Laboratory at ORNL available for teaching purposes. The primary instrument being used is the Hitachi HF-2000 field emission TEM, which is controlled by Gatan's DigitalMicrograph™ (DM) software and uses a Ik by Ik CCD camera for digital imaging.
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