Abstract
Te K-edge EXAFS (extended X-ray absorption fine structure) of trigonal Te and amorphous TexC1-x alloy films prepared by the rf sputtering technique have been measured in order to determine the local structure around Te atoms. EXAFS parameters (backscattering amplitude and phase function) are determined for Te atoms. The Debye-Waller factors are also obtained for trigonal Te and the TexC1-x alloys. The average coordination number of a Te atom in amorphous TexC1-x is found to be smaller than in trigonal Te with the disappearance of interchain coupling in these amorphous alloys. Further, the Te–Te distance in a-TexC1-x is gradually shortened with an increase of the carbon content compared with that in trigonal Te.
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