Abstract
Te–Ge reactive diffusion has been studied by in situ XRD, in situ TEM, and atom probe tomography in a sample made of a poly-Te layer deposited on an amorphous Ge layer, and compared to the reverse case of an a-Ge layer deposited on a poly-Te layer.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
