Abstract
Cross sections for target Ar K-shell ionization associated with single and double electron capture, as well as the same cross sections corresponding to projectile F K X-rays and the total cross sections for single and double capture, were determined for 1.8–2.2 MeV/u F9+,8+,7+ projectiles. This work was performed at Western Michigan University using the tandem Van de Graaff accelerator. Coincidences between emitted X-rays and their corresponding charge-changed particles were detected. The Ar K X-ray coincidence cross section ratios for double to single capture are found to depend strongly on the incident charge state, with the ratios for F9+ well exceeding unity. Possible explanations for this anomalous behavior are discussed but a conclusive explanation is not found. The results are compared to previous experiments using fully-stripped fluorine where coincidence techniques were not employed.
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More From: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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