Target and projectile cross sections for F ions on Ti, V, Cr, Fe, and Co: 1.7 MeV/amu

Abstract

Measurements of the target-thickness dependences of the target $K$ x-ray production yields are reported for 1.7-MeV/amu ${\mathrm{F}}^{q+}$ ($q=6, 8, \mathrm{and} 9$) ions incident upon thin solid targets of elements from Ti to Co. Target $K$ x-ray production cross sections were extracted in the limit of vanishing target thickness. Comparisons of the data to theoretical estimates based upon combinations of direct ionization and electron-transfer processes are presented. Projectile $K$-vacancy production and quenching cross sections were obtained from the three-component model for the target $K$ x-ray data as a function of foil thickness. Comparisons of the projectile parameters to theoretical estimates based upon electron transfer, direct ionization, and excitation processes are presented.