Abstract
This study explores a new dimension of accelerated life testing by analyzing competing risk data through Tampered Random Variable (TRV) modeling, a method that has not been extensively studied. This method is applied to simple step-stress life testing (SSLT), and it considers multiple causes of failure. The lifetime of test units under changeable stress levels is modeled using Power Rayleigh distribution with distinct scale parameters and a constant shape parameter. The research introduces unique tampering coefficients for different failure causes in step-stress data modeling through TRV. Using SSLT data, we calculate maximum likelihood estimates for the parameters of our model along with the tampering coefficients and establish three types of confidence intervals under the Type-II censoring scheme. Additionally, we delve into Bayesian inference for these parameters, supported by suitable prior distributions. Our method’s validity is demonstrated through extensive simulations and real data application in the medical and electrical engineering fields. We also propose an optimal stress change time criterion and conduct a thorough sensitivity analysis.
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