Abstract
We report the realization of a Tamm plasmon resonance in a planar structure by deposition of a gold film on a one-dimensional photonic crystal made of mesoporous silicon. The observation of a dip in the reflectance as well as a singularity in the ellipsometric angles confirms the presence of Tamm plasmon-polaritons with a higher quality factor than previously reported for porous Tamm structures. The simple electrochemical fabrication process of the porous silicon multilayer has the potential to facilitate the advent of integrated Tamm sensors by allowing an analyte to diffuse to the region where the electromagnetic field enhancement is highest while being low-cost and potentially CMOS-compatible.
Highlights
Tamm plasmon-polaritons (TPPs) are optical modes existing at the interface of a metal and a periodic dielectric multilayer known as a one-dimensional photonic crystal (PC) [1, 2]
Sensors utilizing the surface plasmon resonance on noble metals are common place in biology, but because the SPP dispersion relation is outside the light cone those measurements are performed either with a coupling prism, known as the KretschmannRaether configuration, or with a grating etched in the metal [7]
While the high-intensity electric field of SPPs extends into free space above the metal, the electric field of the TPPs is localized within the PC where it is not accessible
Summary
Tamm plasmon-polaritons (TPPs) are optical modes existing at the interface of a metal and a periodic dielectric multilayer known as a one-dimensional photonic crystal (PC) [1, 2]. Sensors utilizing the surface plasmon resonance on noble metals are common place in biology, but because the SPP dispersion relation is outside the light cone those measurements are performed either with a coupling prism, known as the KretschmannRaether configuration, or with a grating etched in the metal [7] Both approaches are difficult to implement in high-throughput microarray experiments since they are performed at a large oblique angle of incidence [8]. We observed a dip in the measured reflectance of a PSi PC coated with gold (Fig. 1b), which we explain as a signature of the Tamm resonance using an analytical model for 1D electromagnetic waves The width of this resonance, related to the quality factor, is of first importance for sensing applications since it determines the sensitivity of the structure to a change in refractive index within the PC. The measured quality factor of the fabricated device is superior than for previous experimental demonstrations of TPPs in the same wavelength range
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