Abstract

We analyze the fundamental properties of optical waves referred to as Tamm plasmon modes (TPMs) which are tied to the interface of a semi-infinite two-phase metallodielectric superlattice with an arbitrary homogeneous capping medium. Such modes offer new ways of achieving high electromagnetic field localization and spontaneous emission enhancement in the vicinity of the interface in conjunction with absorption loss management, which is crucial for future applications. The homointerface, formed when the capping medium has the same permittivity as one of the superlattice constituents, is found to support a TPM whose dispersion overlaps the single-interface surface plasmon polariton (SPP) dispersion but which has a cut off at the topological transition point. In contrast, a heterointerface formed for an arbitrary capping medium, is found to support multiple TPMs whose origin can be traced by considering the interaction between a single-interface SPP and the homointerface TPM burried under the top layer of the superlattice. By carrying out a systematic comparison between TPMs and single-interface SPPs, we find that the deviations are most pronounced in the vicinity of the transition frequency for superlattices in which dielectric layers are thicker than metallic ones.

Highlights

  • By carrying out a systematic comparison between Tamm plasmon modes (TPMs) and single-interface surface plasmon polariton (SPP), we find that the deviations are most pronounced in the vicinity of the transition frequency for superlattices in which dielectric layers are thicker than metallic ones

  • This paper presents a systematic analysis of surface waves on two-phase semi-infinite metallodielectric superlattices

  • As their character is determined by the properties of the periodic arrangement of unit cells, in analogy with surface electronic states in crystals, these waves are termed Tamm plasmon modes

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Summary

Introduction

We analyze the conditions for the TPM existence for both metallic and dielectric capping layers, and determine their dispersion, propagation lengths as well as the TPM resonance strength quantified by the reflection coefficient residue at the TPM pole, which is proportional to the power a point dipole placed close to the interface would emit into the mode[18].

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