Abstract
Electric field standing waves (EFSW) that establish within thin films during their characterization by reflection–absorption infrared (RAIR) spectroscopy are shown to result in a >25-fold enhancement in the intensity of absorbance features in a molecularly thin methane (Me) layer buried within Argon (Ar) films. Using an all-optical depth profiling method and describing the interference effects responsible for these phenomena using a classical optics model, modulations in the EFSW amplitude at specific sample thicknesses are demonstrated to be responsible for these strong deviations from Beer–Lambert behavior. Tuning sample thickness is shown to enable the EFSW depth profile to be tailored, conferring greatly enhanced sensitivity and increased spatial selectivity to RAIR spectroscopy. These are highly desirable attributes for the characterization of interfacial structures and mesoscopic dynamic processes within complex buried multilayer assemblies and stratified composite films used to model and study a range of materials and life science phenomena.
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