T-junction waveguide experiment to characterize left-handed properties of metamaterials

Abstract

The left-handed property of a metamaterial is demonstrated by measuring the power at the output of a T-junction waveguide loaded with a metamaterial having one edge cut at 45° with respect to the waveguide axis. Both experimental scattering data and numerical results are presented. The metamaterial sample is realized by using a periodic arrangement of wires and split-ring resonators, and the operating frequency is chosen to correspond to a refraction index of about −1. The results show that when the T junction is empty, most of the power is received at the output port directly facing the input port, whereas when it is loaded with the sample of metamaterial, most of the power is received at the output port perpendicular to the input axis. This indicates that the energy is bent by the oblique edge of the sample by an angle of −45° with respect to the normal, which suggests a negative index of refraction.