Abstract
This paper analyzes the systematic errors in Hadamard transform optical instruments caused by moving masks, incorrect mask alignment, faulty mask fabrication, missing data, diffraction, etc. and describes techniques for reducing or eliminating these errors. In a great many cases the behavior of the instrument can be characterized by a single matrix equation of the form eta = TWa + e, where the components of eta are the measurements, T is a matrix characterizing the instrument, W specifies the mask configurations, a is a vector containing the unknown spectral intensities, and the components of e are small random errors.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
